Electron microscopes

Description

NGU is seeking through this negotiated procedure for a supplier for a Scanning Electron Microscope (SEM) instrument and accessories, as described in Appendix 1_2, along with goods and services needed for supply and delivery, installation and calibration, software, maintenance and disposal of after-sale services. The SEM instrument is to be used for the identification and characterization (hereunder spatial distribution) of minerals and related materials by SE, BSE, EDS and hyperspectral cathodoluminescence CL and/or morphological imaging of sub-nm scale features. All these detectors shall be included. The SEM instrument shall be able to accommodate additional super-high resolution WDS and uXRF detectors to be purchased later. The SEM instrument shall be able to load via air lock default standard-sized ~28×48mm petrographic thin sections and/or polished blocks ø30×10mm (plastiline-mounted on a standard petrographic carrier glass). The Geological Survey of Norway (NGU) is a department under the Ministry of Trade, Industry and Fisheries (NFD). NGU's main assignments are to collect, process and communicate knowledge of the physical, chemical, and mineralogical qualities of the country's bedrock, uncompacted matter, ground water, and to map Norway's land and sea areas. Further information on NGU can be found at www.ngu.no. NGU is seeking through this negotiated procedure for a supplier for a Scanning Electron Microscope (SEM) instrument and accessories, as described in Appendix 1_2, along with goods and services needed for supply and delivery, installation and calibration, software, maintenance, and disposal of after-sale services. Tenders must include freight, installation, training, consumables, software for controlling the instruments, other necessary components, etc. The SEM instrument is to be used for the identification and characterization (hereunder spatial distribution) of minerals and related materials by SE, BSE, EDS, hyperspectral cathodoluminescence CL and/or morphological imaging of sub-nm scale features. The SEM instrument shall be able to accommodate additional super-high resolution WDS and uXRF detectors to be purchased later. The SEM instrument shall be able to load via air lock default standard-sized ~28×48mm petrographic thin sections and/or polished blocks ø30×10 mm (plastiline-mounted on a standard petrographic carrier glass). Larger samples can be loaded via the chamber door. The sample chamber must have an 'air lock' system. This procurement comes under the available budget. This purchase is subject to budgetary coverage. NGU takes the reservation that awarding a contract is subject to funding availability.