Purchase of Atomic Force Microscope System

Description

The University wishes to purchase a complete Atomic Force Microscope (AFM) system that will primarily be used for characterization of two-dimensional materials, including mechanically exfoliated monolayer samples and heterostructures of stacked layers that exhibit moire superlattices and reconstructed domains. Lot 1: The University wishes to purchase a complete Atomic Force Microscope (AFM) system that will primarily be used for characterization of two-dimensional materials, including mechanically exfoliated monolayer samples and heterostructures of stacked layers that exhibit moire superlattices and reconstructed domains. The AFM should be a fully equipped stand-alone system that: includes a large suit of standard and advanced imaging modes, provides high levels of automation, and provides substantial technical support, system upgrades, and extended warranty. The equipment will be located in the Quantum Photonics Laboratory in the School of Engineering & Physical Sciences located on the Edinburgh Campus. This ITT is being carried out in accordance with the Open Accelerated Procedure as set out in the Regulations which implement Directive 2014/24/EC and Public Contracts (Scotland) 2015 Regulation 28(5). This is due to funding and research requirements.