Awarded contract

Published

Scanning electron microscopes

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Value

1,023,124 EUR

Current supplier

FEI Deutschland GmbH

Description

Die Auftraggeberin (AG) beschafft eine FIB/SEM Kombinationsanlage mit ToF-SIMS Detektor. Die Auftraggeberin (AG) beschafft eine FIB/SEM Kombinationsanlage mit ToF-SIMS Detektor.

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