Awarded contract
Published
X-ray diffraction (XRD) system
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Description
A user-friendly X-ray diffraction system for structural material analyses, particularly thin films. The system must allow use of both ‘out of plane’ and ‘in-plane diffraction’ measurement of thin films with thicknesses varying between nanometer and micrometer areas. Lot 1: A user-friendly X-ray diffraction system for structural material analyses, particularly thin films. The system must allow use of both ‘out of plane’ and ‘in-plane diffraction’ measurement of thin films with thicknesses varying between nanometer and micrometer areas. Lot 1: A user-friendly X-ray diffraction system for structural material analyses, particularly thin films. The system must allow use of both ‘out of plane’ and ‘in-plane diffraction’ measurement of thin films with thicknesses varying between nanometer and micrometer areas.
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