Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester

Description

The University of Warwick has a requirement to purchase a Dynamic Reliability & Robustness Power Characterisation Tester designed for testing wide bandgap (SiC and GaN) power semiconductor devicE. <br /><br />In order to express interest in this opportunity please go to the University of Warwick In-Tend supplier portal (https://in-tendhost.co.uk/universityofwarwick).<br /><br />The University of Warwick is not a contracting authority for the purposes of the Public Contracts Regulations 2015 (as amended) or the Procurement Act 2023 and associated Procurement Regulations 2024 (and as may be amended from time to time) and its procurement activities are not subject to the requirements set out therein or the obligations under the European Public Procurement Directives, including the European Remedies Directive. Should the University advertise contracts in the Official Journal of the European Union, Find-A-Tender platform or other contract opportunity advertising site or platform, this is at the sole discretion of the University and is undertaken on a voluntary basis with no implied obligation to comply with the procurement legislation.<br /><br />