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LA2816C MTU RFT for the Supply, Delivery, Installation and Commissioning of an Automated White Light Interferometry

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Description

One (1) white-light scanning interferometry-based 3D profilometer with sub nm resolution is required. The requirement is an automated white light interferometry system for the measurement of surface roughness and other associated features. The system should have a motorised focus and sample stage and automated control over the optical path with a variety of objectives and working distances. The system will feature a modern PC based control and be capable of automated stitching over large areas.

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