Awarded contract
Published
DTU Electromagnetic Test Centre — Phase II
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Value
1,575,648 EUR
Current supplier
NSI-MI Technologies, LLC
Description
DTU is establishing the DTU Electromagnetic Test Centre (DTU ETC) for high-accuracy testing of antennas, components and circuits, as well as materials and scattering structures. The DTU ETC will comprise several laboratories in the existing building 353 and a new building 357. Phase I of the DTU ETC was initiated in 2016 and completed in 2018, while phase II was initiated in 2017 and will be completed in 2022. This procurement includes the following 3 different test facilities: — millimetre-wave antenna test facility; — millimetre-wave component and circuit test facility; — multipurpose antenna test facility. The tender covers the above-mentioned three facilities, but so far DTU has only signed contracts for the first two. For the third facility/lot, DTU has finalized the evaluation and awarded the contract, but it is uncertain whether a contract can be signed. Once this is clarified DTU will publish an additional contract award notice covering the third/last lot. Lot 1: C, Millimetre-Wave Antenna Test Facility ETC millimetre-wave antenna test facility for determining the radiation pattern and the gain of antennas. This could be high, medium, or low directivity/gain antennas, isolated antennas fed through a coaxial cable or a waveguide, or integrated/on-chip antennas fed through an integrated transmission line. It is anticipated that this measurement facility will be a spherical near-field configuration that may also serve as a far-field configuration for higher frequencies and proper electrical size of the antenna under test; alternatively, this measurement facility may be a compact range configuration. Lot 2: D, Millimetre-Wave Component and Circuit Test Facility Description of test facility: millimetre-wave component and circuit test facility, which is one of the DTU ETC laboratories and will be located in the new building 357. The essential requirement to this facility is to provide interference-free environment for testing high sensitivity electronic components and integrated circuit chips in the extended frequency range.
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