Electron Spectroscopy/Microscopy System

Description

PEEM instrument with high intensity VUV source and high-pressure polarised mercury UV source. Must include all associated electronics, power supplies and software and be capable of being mounted upon and functioning to its maximum potential on our existing surface analysis system for performing electron spectroscopy (Omicron Nanotechnology GmbH). To also include compatible sample transfer mechanism and housing ultrahigh vacuum module. Lot 1: A state-of-the-art instrument for performing energy-filtered photoemission electron microscopy (PEEM) with a high stability sample stage. A high intensity VUV source, a high-pressure mercury UV source and polariser. Electronics, power supplies, software, high performance camera, imaging unit and other associated peripherals. System capable of performing multiple techniques including energy-filtered PEEM and k-space imaging (momentum microscopy) with various contrast mechanisms and suitable for mounting directly on existing surface analysis system for performing electron spectroscopy (Omicron Nanotechnology GmbH). Lot 2: An ultrahigh vacuum system module capable of housing an instrument for performing photoemission electron microscopy and associated techniques (Lot 1) along with necessary sample preparation and transfer capability and required differential pumping. Includes a bespoke bakeable ultrahigh vacuum chamber with extended three-axis sample manipulator and wobble stick allowing sample transfer. To be mounted on existing surface analysis system for performing electron spectroscopy (Omicron Nanotechnology GmbH) and includes bespoke bakeout jacket and physical support structure.