Awarded contract
Published
Modification of Contract for Analytical Focused Ion Beam Scanning Electron Microscope
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Description
FIB-SEM upgrade for High Resolution ToF-SIMS, 2nd IR camera for EBSD geometry and Manual Load Lock. Additional information: It was a min-competition against Lot 2 of the NWUPC Framework Agreement for High Value Laboratory Equipment (HVLE) Reference Number LAB3162 NW.
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