Supply, Installation and Commissioning of an Atomic Force Microscope

Description

The Centre for Process Innovation Ltd (CPI) requires the following; Atomic Force Microscopy (AFM) is a surface profiling technique which allows the topography of nanostructured surfaces to be mapped. Primarily AFMs are used for surface profiling and particle sizing however a series of secondary modes can provide maps of electrical conductivity, surface potentials and mechanical properties. As such a large sample area AFM will form an important characterization tool for the CPI's graphene centre where materials lateral dimensions and height must be measured independently. In addition the AFM will also support the characterization of spherical particles, conductive inks and vapour deposited films. The AFM will be used primarily for particle sizing and surface topography. However it will also be used to measure the conductivity of poorly conducting inks, surface potentials of vapour deposited films, and the mechanical properties of polymer composites. The latter application requires the ability to cycle the temperature (see URS specification) through the polymer glass transition, melt and cure temperatures. Please visit https://ne1procurementservices.com for further information.