Awarded contract

Published 2 years ago

FIB-SEM-Nanocharakterisierungsplattform

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Buyer

Hochschule Hamm-Lippstadt

Value

1,280,000 EUR

Current supplier

Carl Zeiss Microscopy Deutschland GmbH

Description

Lieferung und Installation eines Rasterelektronenmikroskops mit integrierter FIB Säule Lot 1: Es wird ein Rasterelektronenmikroskops mit integrierter FIB Säule in sich kreuzender Anordnung und integrierten Komponenten zur Analyse beschafft. Die technischen ANforderungen ergeben sich im Einzelnen aus der Leistungsbeschreibung. Die Lieferung soll möglichst im Jahr 2023 erfolgen.

Personalised AI Summary

Product / service

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Contract structure

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Organisation mentioned

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Supplier requirements

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