Awarded contract
Published
Darkfield and scanning probe microscopes
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Description
Strumento per misure in tempo reale di spettroscopia Raman, microscopia a forza atomica (AFM) ed elettrochimica tutte operanti simultaneamente. Strumento per misure in tempo reale di spettroscopia Raman, microscopia a forza atomica (AFM) ed elettrochimica tutte operanti simultaneamente. CIG: 8359056F37
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Università di Pisa
230,000 EUR
Published 4 years ago
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