Awarded contract
Published
Scanning electron microscopes
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Description
A high resolution scanning electron microscope (SEM) is required for the nano-scale analysis and imaging of III-V compound semiconductor samples. Tenders will only be considered for complete systems comprising Imaging microscope, control software, image capture software and (Specified) EDX detector and associated software. A high resolution scanning electron microscope (SEM) is required for the nano-scale analysis and imaging of III-V compound semiconductor samples. Tenders will only be considered for complete systems comprising Imaging microscope, control software, image capture software and (Specified) EDX detector and associated software.
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