Awarded contract
Published
Equipment- & Prozessspezifikationen Wafer Level Rasterkraftmikroskop für optische Absorptionsmessungen mit nm-Auflösung
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Close date
2024-07-23
Description
PR659318 - 3340 - W Equipment- & Prozessspezifikationen Wafer Level Rasterkraftmikroskop für optische Absorptionsmessungen mit nm-Auflösung / Photoinduced Force Mircroscopy PiFM
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Landeshauptstadt Dresden
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Published a year ago
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