Awarded contract
Published
Plasma Focused Ion Beam (PFIB) mit Rasterelektronenmikroskop (SEM)
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Description
Plasma Focused Ion Beam (PFIB) mit Rasterelektronenmikroskop (SEM) Lot 1: Für das Wissenschaftliche Zentrum für Materialwissenschaften (WZMW) der Philipps-Universität Marburg soll ein fabrikneues Plasma Focused Ion Beam (PFIB) mit Rasterelektronenmikroskop (SEM) angeschafft werden. Als Finanzierungslimit stehen maximal 1.890.000 Euro inkl. MWST zur Verfügung. Angebote oberhalb dieses Limits müssen daher zwingend ausgeschlossen werden.
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