Awarded contract

Published

Plasma Focused Ion Beam (PFIB) mit Rasterelektronenmikroskop (SEM)

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Value

1,588,235 EUR

Current supplier

FEI Deutschland GmbH

Description

Plasma Focused Ion Beam (PFIB) mit Rasterelektronenmikroskop (SEM) Lot 1: Für das Wissenschaftliche Zentrum für Materialwissenschaften (WZMW) der Philipps-Universität Marburg soll ein fabrikneues Plasma Focused Ion Beam (PFIB) mit Rasterelektronenmikroskop (SEM) angeschafft werden. Als Finanzierungslimit stehen maximal 1.890.000 Euro inkl. MWST zur Verfügung. Angebote oberhalb dieses Limits müssen daher zwingend ausgeschlossen werden.

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